Showing results: 256 - 270 of 602 items found.
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XMC850 -
Silicon Control Inc.
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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VPX850 -
Silicon Control Inc.
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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U1161A -
Keysight Technologies
The Keysight U1161A extended test lead kits are compatible with the U1230, U1240, U1250, and U1270 Series handheld digital multimeters. The set includes two extension test leads (one red and one black), two test probes, medium-sized alligator clips, and 4 mm banana plugs.
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MicroContact AG
With the micro probes and the fine-pitch adapters used on them, you are able to contact the finest test structures. E-tests, functional tests, IC tests or high-current tests are made to be affordable, efficient and with a short cycle time. With the integration of HF adapters we also enable the double-sided testing of HF substrates up to high frequency ranges.
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Elcometer Limited
Supplied with either standard cables or armoured metal reinforced heavy duty cables, Elcometer surface profile probes are supplied with a glass zero tile, calibration test foils (nominal values 125μm (5.0mils) & 508μm (20mils)) and an Elcometer test certificate.
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Seibersdorf Labor GmbH
During the recent years we have made scientific investigations regarding calibration procedures, which have been published and integrated in the European and International standards. The calibration of antennas and field probes in Seibersdorf is done on the reference open area test site, in three different TEM-Cells and in the fully anechoic chamber. The open area test site is one of the best in Europe. Since 1996 we are the accredited calibration laboratory according to Akkreditierung Austria 0612 for antennas and field probes.
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QTOUCH1404C -
Qmax Test Technologies Pvt. Ltd.
The Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built high resolution Vision Camera for easy monitoring of probe needle contact. The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision.
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STAr Technologies, Inc.
STAr's functional test cantilever probe cards represent the finest technology on the market for wafer-sort, built-in self-tests (BIST), known good die (KGD), burn-in, image sensor etc.
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3954 -
Technobox, Inc.
The extender/analysis probe permits extension of a PMC card beyong the edge of a host processor front panel, providing access to both Side 1 and Side 2 of a PMC under test.
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Nidec-Read Corporation
MEMS Spring Probe is developed by NIDEC-READ original ultra-fine 3D processing technology and enables our customer to supply advanced and innovative test solutions at PCB & semiconductor testing market.
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T10 -
SONOTEC GmbH
The T10 structure-borne sound probe can be used to monitor the condition of machines, systems and processes, provided that they generate detectable structure-borne sound in the ultrasonic range. Changes in the sound signals indicate a change in the condition and/or process of the plant. The detection of these changes forms the basis for condition monitoring in preventive maintenance. The T10 structure-borne sound probe is used when the installation space is very limited or the test specimen must not be loaded with a large sensor mass. The T10 structure-borne sound probe is also suitable for use on non-magnetic surfaces.
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ESR70 -
Peak Electronic Design Ltd.
The Atlas ESR provides instant measurement of a capacitor's ESR and it's capacitance value. Using the supplied gold plated probes (removable), the Atlas ESR can measure ESR down to a resolution of 0.01 ohms, up to 40 ohms. It can even measure ESR for capacitors that are in-circuit. Measurements are made at the industry standard frequency of 100kHz. Probes are now removable, allowing 2mm compatible probes to be fitted. Audible alerts are produced for various ESR levels allowing you to perform many tests in succession without having to look at the display.
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Elcometer Limited
Supplied with either standard cables or armoured metal reinforced heavy duty cables, Elcometer convex surface profile probes are supplied with a glass zero tile, calibration test foils (nominal values 125μm (5.0mils) & 508μm (20mils)) and an Elcometer test certificate.
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ISDB-T/Tb -
TestTree
Network operators:automate the tests of new transmittertemporary monitoring/investigation toolrebroadcasting receiver: RF to ASI or IPBroadcasters: off-air monitoring probe to validate the on-air contentTV/STB producers: automated tests against a professional receiverLabs: easy & simple access to live DTV sources via RF
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STATOGRAPH® Product Family -
Foerster Instruments, Incorporated
The STATOGRAPH product family is used for testing surface cracks with the help of eddy current sensors. Eddy current testing for material cracks requires the appropriate evaluation electronics and probes adapted to the testing task. Depending on the test situation and test object, the STATOGRAPH family of test instruments offers the right system for this purpose.